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 CPC7594
Line Card Access Switch
Features
* * * * TTL logic level inputs for 3.3V logic interfaces Smart logic for power up / hot plug state control Small 16-pin SOIC or 16-pin DFN Package DFN package printed-circuit board footprint is 60 percent smaller than the SOIC version, 70 percent smaller than 4th generation EMR solutions. Monolithic IC reliability Low matched RON Eliminates the need for zero cross switching Flexible switch timing to transition from ringing mode to talk mode. Clean, bounce-free switching Tertiary protection consisting of integrated current limiting, voltage clamping, and thermal shutdown for SLIC protection 5 V operation with power consumption < 10 mW Intelligent battery monitor Latched logic-level inputs, no external drive circuitry required
Description
The CPC7594 is a member of Clare's next generation Line Card Access Switch family. This monolithic 6-pole solid-state switch is available in either a 16-pin SOIC or a 16-pin DFN package. It provides the necessary functions to replace two 2-Form-C electro-mechanical relays used on traditional analog and contemporary integrated voice and data (IVD) line cards found in Central Office, Access, and PBX equipment. Because this device contains solid state switches for tip and ring line break, ringing injection/return and channel test access, it requires only a +5V supply for operation and TTL logic-level inputs for control. The CPC7594 is particularly designed for IVD line cards where an EMR is required for line test due to the high frequencies typical of ADSL but solid-state switches are desired for switching and test-in functions. The CPC7594xC logic differs from the CPC7594xA/B logic by providing a monitor function during the test state.
* * * * * *
* * *
Applications
* * * * * * * * * VoIP Gateways Central office (CO) Digital Loop Carrier (DLC) PBX Systems Digitally Added Main Line (DAML) Hybrid Fiber Coax (HFC) Fiber in the Loop (FITL) Pair Gain System Channel Banks
Ordering Information
CPC7594 part numbers are specified as shown here: B - 16-pin SOIC delivered 50/Tube, 1000/Reel M - 16-pin DFN delivered 52/Tube, 1000/Reel
CPC7594 x x xx
TR - Add for Tape & Reel Version A - With Protection SCR B - Without Protection SCR C - With Protection SCR and "Monitor Test State"
Figure 1. CPC7594 Block Diagram
TTEST (TCHANTEST) 5 TRINGING 1 +5VDC 6 VDD
XSW3
Tip
Secondary Protection
X SW5 X
CPC7594
3 TBAT
TLINE 4
SW1 SLIC RLINE 13 SW2
Ring
X
14 RBAT
XSW4
XSW6
VREF
Switch Control Logic
L A T C H 7
9 10 11
INTEST INRINGING LATCH
VBAT 12 RRINGING
RINGING
6
300 (min.)
2 FGND
SCR Trip Circuit (CPC7594xA/C)
15 VBAT
8 DGND
TSD
RTEST (RCHANTEST)
Pb
DS-CPC7594 - R03
RoHS
2002/95/EC
e3
1
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CPC7594
1. Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.1 Package Pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.2 Pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.3 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 1.4 ESD Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 1.5 General Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 1.6 Switch Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 1.6.1 Break Switches, SW1 and SW2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 1.6.2 Ringing Return Switch, SW3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 1.6.3 Ringing Switch, SW4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 1.6.4 Test Switches, SW5 and SW6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 1.7 Digital I/O Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 1.8 Voltage and Power Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 1.9 Protection Circuitry Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 1.10 Truth Tables. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 1.10.1 CPC7594xA and CPC7594xB Truth Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 1.10.2 CPC7594xC Truth Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.1.1 CPC7594xA and CPC7594xB Logic States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.1.2 CPC7594xC Logic States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.2 Under Voltage Switch Lock Out Circuitry. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.2.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.2.2 Hot Plug and Power Up Circuit Design Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3 Switch Logic. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3.1 Start-up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3.2 Switch Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3.3 Make-Before-Break Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3.4 Break-Before-Make Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.3.5 Alternate Break-Before-Make Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.4 Data Latch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.5 TSD Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.6 Ringing Switch Zero-Cross Current Turn Off . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.7 Power Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.8 Battery Voltage Monitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.9 Protection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.9.1 Diode Bridge/SCR. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.9.2 Current Limiting function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.10 Thermal Shutdown. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.11 External Protection Elements. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3. Manufacturing Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.1 Mechanical Dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.1.1 DFN. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.1.2 SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.2 Printed-Circuit Board Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.2.1 DFN. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.2.2 SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.3 Tape and Reel Packaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.3.1 DFN. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.3.2 SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.4 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.4.1 Moisture Reflow Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.4.2 Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.5 Washing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 12 12 12 12 12 13 13 13 13 13 14 14 15 15 16 16 16 16 16 17 17 17 18 18 18 18 19 19 19 19 19 20 20 20 20 20
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R03
CPC7594
1. Specifications
1.1 Package Pinout 1.2 Pinout Pin
16 RTEST
CPC7594
TTEST 1 FGND 2 TBAT 3 TLINE 4 TRINGING 5 VDD 6 TSD 7 DGND 8
Name TTEST FGND TBAT TLINE VDD TSD DGND INTEST LATCH RLINE RBAT VBAT RTEST
Description Tip lead of the test bus Fault ground Tip lead to the SLIC Tip lead of the line side +5 V supply Temperature shutdown pin Digital ground Logic control input Data latch enable control input Ring lead of the line side Ring lead to the SLIC Battery supply Ring lead of the test bus
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
15 VBAT 14 RBAT 13 RLINE 12 RRINGING 11 LATCH 10 INRINGING 9 INTEST
TRINGING Ringing generator return
INRINGING Logic control input RRINGING Ringing generator source
R03
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3
CPC7594
1.3 Absolute Maximum Ratings Parameter +5 V power supply (VDD) Battery Supply DGND to FGND Separation Logic input voltage Logic input to switch output isolation Switch open-contact isolation (SW1, SW2, SW3, SW5, SW6) Switch open-contact Isolation (SW4) Operating relative humidity Operating temperature Storage temperature Minimum Maximum -0.3 -5 -0.3 5 -40 -40 7 -85 +5 VDD + 0.3 320 320 465 95 +110 +150 Unit V V V V V V V % C C 1.5 General Conditions Unless otherwise specified, minimum and maximum values are guaranteed by production testing requirements. Typical values are characteristic of the device at 25 C and are the result of engineering evaluations. They are provided for information purposes only and are not part of the testing requirements. Specifications cover the operating temperature range TA = -40 C to +85 C. Also, unless otherwise specified all testing is performed with VDD = 5 Vdc, logic low input voltage is 0 Vdc and logic high voltage is 5 Vdc. 1.4 ESD Rating ESD Rating (Human Body Model) 1000 V
Absolute maximum electrical ratings are at 25C.
Absolute Maximum Ratings are stress ratings. Stresses in excess of these ratings can cause permanent damage to the device. Functional operation of the device at conditions beyond those indicated in the operational sections of this data sheet is not implied.
4
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R03
CPC7594
1.6 Switch Specifications 1.6.1 Break Switches, SW1 and SW2 Parameter Test Conditions VSW1 (differential) = TLINE to TBAT VSW2 (differential) = RLINE to RBAT All-Off state. +25 C, VSW (differential) = -320 V to gnd VSW (differential) = +260 V to -60 V +85 C, VSW (differential) = -330 V to gnd VSW (differential) = +270 V to -60 V -40 C, VSW (differential) = -310 V to gnd VSW (differential) = +250 V to -60 V ISW(on) = 10 mA, 40 mA, RBAT and TBAT = -2 V On Resistance +25 C +85 C -40 C On Resistance Matching DC current limit Per SW1 & SW2 On Resistance test conditions. VSW (on) = 10 V, +25 C VSW (on) = 10 V, +85 C VSW (on) = 10 V, -40 C Dynamic current limit (t 0.5 s) Break switches on, all other switches off. Apply 1 kV 10x1000 s pulse with appropriate protection in place. +25 C, Logic inputs = gnd, VSW (TLINE, RLINE) = 320 V Logic input to switch output isolation +85 C, Logic inputs = gnd, VSW (TLINE, RLINE) = 330 V -40 C, Logic inputs = gnd, VSW (TLINE, RLINE) = 310 V dv/dt sensitivity ISW ISW ISW RON 80 RON 14.7 21.1 10.7 0.15 300 160 400 2.5 0.1 0.3 0.1 500 V/s 1 A 28 0.8 425 A ISW 0.1 Symbol Minimum Typical Maximum Unit
Off-State Leakage Current
0.3
1
A
0.1
mA
R03
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5
CPC7594
1.6.2 Ringing Return Switch, SW3 Parameter Test Conditions VSW3 (differential) = TLINE to TRINGING All-Off state. +25 C, VSW (differential) = -320 V to gnd VSW (differential) = +260 V to -60 V +85 C, VSW (differential) = -330 V to gnd VSW (differential) = +270 V to -60 V -40 C, VSW (differential) = -310 V to gnd VSW (differential) = +250 V to -60 V ISW(on) = 0 mA, 10 mA, +25 C On Resistance ISW(on) = 0 mA, 10 mA, +85 C ISW(on) = 0 mA, 10 mA, -40 C VSW (on) = 10 V, +25 C DC current limit VSW (on) = 10 V, +85 C VSW (on) = 10 V, -40 C Dynamic current limit (t 0.5 s) Ringing switches on, all other switches off. Apply 1 kV 10x1000 s pulse with appropriate protection in place. +25 C, Logic inputs = gnd, VSW (TRINGING, TLINE) = 320 V Logic input to switch output isolation +85 C, Logic inputs = gnd, VSW (TRINGING, TLINE) = 330 V -40 C, Logic inputs = gnd, VSW (TRINGING, TLINE) = 310 V dv/dt sensitivity ISW ISW ISW 70 RON ISW 0.1 Symbol Minimum Typical Maximum Unit
Off-State Leakage Current
0.3
1
A
0.1 51 75 39 135 85 210 2.5 0.1 0.3 0.1 500 V/s 1 A A mA 100
6
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R03
CPC7594
1.6.3 Ringing Switch, SW4 Parameter Test Conditions VSW4 (differential) = RLINE to RRINGING All-Off state. +25 C VSW (differential) = -255 V to +210 V VSW (differential) = +255 V to -210 V +85 C VSW (differential) = -270 V to +210 V VSW (differential) = +270 V to -210 V -40 C VSW (differential) = -245 V to +210 V VSW (differential) = +245 V to -210 V On Resistance On Voltage On-State Leakage Current Steady-State Current* Surge Current* Release Current ISW (on) = 70 mA, 80 mA ISW (on) = 1 mA Inputs set for ringing -Measure ringing generator current to ground. Inputs set for ringing mode. Ringing switches on, all other switches off. Apply 1 kV 10x1000 s pulse with appropriate protection in place. SW4 transition from on to off. +25 C, Logic inputs = gnd, VSW (RRINGING, RLINE) = 320 V Logic input to switch output isolation +85 C, Logic inputs = gnd, VSW (RRINGING, RLINE) = 330 V -40 C, Logic inputs = gnd, VSW (RRINGING, RLINE) = 310 V dv/dt sensitivity *Secondary protection and current limiting must prevent exceeding this parameter.
Symbol
Minimum
Typical
Maximum
Unit
0.05
Off-State Leakage Current
ISW
-
0.1
1
A
0.05 RON VON IRINGING ISW ISW IRINGING 6 1.5 0.1 420 0.10 ISW 0.12 0.10 500 V/s 1 A 15 3 0.25 150 2 V mA mA A A
R03
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7
CPC7594
1.6.4 Test Switches, SW5 and SW6 Parameter Test Conditions VSW1 (differential) = TTEST to TBAT VSW2 (differential) = RTEST to RBAT All-Off state. +25 C, VSW (differential) = -320 V to gnd VSW (differential) = +260 V to -60 V +85 C, VSW (differential) = -330 V to gnd VSW (differential) = +270 V to -60 V -40 C, VSW (differential) = -310 V to gnd VSW (differential) = +250 V to -60 V ISW(on) = 10 mA, 40 mA, RBAT and TBAT = -2 V On Resistance +25 C +85 C -40 C VSW (on) = 10 V, +25 C DC current limit VSW (on) = 10 V, +85 C VSW (on) = 10 V, -40 C Dynamic current limit (t 0.5 s) Break switches on, all other switches off. Apply 1 kV 10x1000 s pulse with appropriate protection in place. +25 C, Logic inputs = gnd, VSW (TLINE, RLINE) = 320 V Logic input to switch output isolation +85 C, Logic inputs = gnd, VSW (TLINE, RLINE) = 330 V -40 C, Logic inputs = gnd, VSW (TLINE, RLINE) = 310 V dv/dt sensitivity ISW ISW ISW 80 RON 38 46 28 125 95 165 2.5 0.1 0.3 0.1 500 V/s 1 A 70 250 A mA ISW 0.1 Symbol Minimum Typical Maximum Unit
Off-State Leakage Current
0.2
1
A
0.1
8
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R03
CPC7594
1.7 Digital I/O Electrical Specifications Parameter Input Characteristics Input voltage, Logic low Input voltage, Logic high Input leakage current, INRINGING and INTEST, Logic high Input leakage current, INRINGING and INTEST, Logic low Input leakage current, LATCH Logic high LATCH Pull-up Minimum Load Input leakage current, LATCH Logic low Input leakage current, TSD Logic high Input leakage current, TSD Logic low Test Conditions Input voltage falling Input voltage rising VDD = 5.5 V, VBAT = -75 V, VHI = 2.4 V Symbol VIL VIH IIH Minimum 0.8 Typical 1.0 1.7 0.1 Maximum 2.0 1 Unit
V A
VDD = 5.5 V, VBAT = -75 V, VIL = 0.4 V VDD = 4.5 V, VBAT = -75 V, VIH = 2.4 V VDD = 4.5 V, VBAT = -75 V, IIN = -10 A Latch input transitions to logic high. VDD = 5.5 V, VBAT = -75 V, VIL = 0.4 V VDD = 5.5 V, VBAT = -75 V, VIH = 2.4 V VDD = 5.5 V, VBAT = -75 V, VIL = 0.4 V
IIL IIH Logic = High IIL IIH IIL
7 True 10 10
0.1 19
1 -
A A
46 16 16
125 30 30
A A A
Output Characteristics Output voltage, VDD = 5.5 V, VBAT = -75 V, ITSD = 10A TSD Logic high Output voltage, TSD Logic low VDD = 5.5 V, VBAT = -75 V, ITSD = 1mA
VTSD_off VTSD_on
2.4 -
VDD 0
0.4
V V
1.8 Voltage and Power Specifications Parameter Voltage Requirements VDD VBAT1
1
Test Conditions -
Symbol VDD VBAT
Minimum 4.5 -19
Typical 5.0 -48
Maximum 5.5 -72
Unit V V
VBAT is used only for internal protection circuitry. If VBAT rises above-10 V, the device will enter the all-off state and will remain in the all-off state until the battery drops below approximately -15 V
Power Specifications VDD = 5 V, VBAT = -48 V, Measure IDD and IBAT, Talk and All-Off States All other states VDD = 5 V, VBAT = -48 V Talk and All-Off states Ringing and Test states VDD = 5 V, VBAT = -72 V, All states P P IDD IDD IBAT www.clare.com 5.5 6.5 1.1 1.3 0.1 10 10 2.0 2.0 10 mW mW mA mA A
9
Power consumption
VDD current VBAT current
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CPC7594
1.9 Protection Circuitry Electrical Specifications Parameter Protection Diode Bridge Forward Voltage drop, continuous current (50/60 Hz) Forward Voltage drop, surge current Surge current Trigger current: Current into VBAT pin. Apply dc current limit of break switches Apply dynamic current limit of break switches SCR activates, +25 C SCR activates, +85 C VF VF 2.1 5 3.0 V Conditions Symbol Minimum Typical Maximum Unit
Protection SCR (CPC7594xA and CPC7594xC) ITRIG IHOLD VTBAT or VRBAT IVBAT VTBAT or VRBAT 110 VBAT -4 134 87 250 184 0.02 -3 -5 * VBAT -2 1.0 A mA mA V A V
SCR remains active, +25 C Hold current: Current through protection SCR SCR remains active, +85 C Gate trigger voltage IGATE = ITRIGGER
Reverse leakage current VBAT = -48 V On-state voltage 0.5 A, t = 0.5 s 2.0 A, t = 0.5 s
Temperature Shutdown Specifications Shutdown activation temperature Shutdown circuit hysteresis Not production tested - limits are guaranteed by design and Quality Control sampling audits. TTSD_on TTSD_off 110 10 125 150 25 C C
*Passes GR1089 and ITU-T K.20 with appropriate secondary protection in place. V BAT must be capable of sourcing ITRIGGER for the internal SCR to activate.
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CPC7594
1.10 Truth Tables 1.10.1 CPC7594xA and CPC7594xB Truth Table State Talk Test Ringing All-Off Latched All-Off
1
INRINGING 0 0 1 1 X X
INTEST 0 1 0 1 X X
LATCH
TSD
Break Switches On Off
Ringing Switches Off Off On Off Unchanged Off
Test Switches Off On Off Off Off
0
Z
1
Off Off
1 X 0 Off
Z = High Impedance. Because TSD has an internal pull up at this pin, it should be controlled with an open-collector or open-drain type device.
1.10.2 CPC7594xC Truth Table State Talk Test/Monitor Ringing All-Off Latched All-Off
1
INRINGING 0 0 1 1 X X
INTEST 0 1 0 1 X X
LATCH
TSD
Break Switches On On
Ringing Switches Off Off On Off Unchanged Off
Test Switches Off On Off Off Off
0
Z1
Off Off
1 X 0 Off
Z = High Impedance. Because TSD has an internal pull up at this pin, it should be controlled with an open-collector or open-drain type device.
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CPC7594
2. Functional Description
2.1 Introduction 2.1.1 CPC7594xA and CPC7594xB Logic States * Talk. Break switches SW1 and SW2 closed, ringing switches SW3 and SW4 open, and test switches SW5 and SW6 open. * Ringing. Break switches SW1 and SW2 open, ringing switches SW3 and SW4 closed, and test switches SW5 and SW6 open. * Test. Break switches SW1 and SW2 open, ringing switches SW3 and SW4 open, and channel test switches SW5 and SW6 closed. * All-off. Break switches SW1 and SW2 open, ringing switches SW3 and SW4 open, and test switches SW5 and SW6 open. 2.1.2 CPC7594xC Logic States The CPC7594xC replaces the Test state with the Test/Monitor state as defined below. * Test/Monitor. Break switches SW1 and SW2 closed, ringing switches SW3 and SW4 open, and test switches SW5 and SW6 closed. The CPC7594 offers break-before-make and make-before-break switching from the ringing state to the talk state with simple TTL level logic input control. Solid-state switch construction means no impulse noise is generated when switching during ring cadence or ring trip, eliminating the need for external zero-cross switching circuitry. State control is via TTL logic-level input so no additional driver circuitry is required. The linear break switches SW1 and SW2 have exceptionally low RON and excellent matching characteristics. The ringing switch, SW4, has a minimum open contact breakdown voltage of 465 V at +25C sufficiently high with proper protection to prevent breakdown in the presence of a transient fault condition (i.e., passing the transient on to the ringing generator). Integrated into the CPC7594 is an over-voltage clamping circuit, active current limiting, and a thermal shutdown mechanism to provide protection for the SLIC during a fault condition. Positive and negative lightning surge currents are reduced by the current limiting circuitry and hazardous potentials are diverted away from the SLIC via the protection diode bridge or the optional integrated protection SCR. Power-cross potentials are also reduced by the current limiting and thermal shutdown circuits. To protect the CPC7594 from an over-voltage fault condition, use of a secondary protector is required. The secondary protector must limit the voltage seen at the tip and ring terminals to a level below the maximum breakdown voltage of the switches. To minimize the stress on the solid-state contacts, use of a foldback or crowbar type secondary protector is highly recommended. With proper selection of the secondary protector, a line card using the CPC7594 will meet all relevant ITU, LSSGR, TIA/EIA and IEC protection requirements. The CPC7594 operates from a single +5 V supply. This gives the device extremely low power consumption in any state with virtually any range of battery voltage. The battery voltage used by the CPC7594 has a two fold function. It is used as a reference and as a current source for the internal integrated protection circuitry under surge conditions. Second, it is used as a reference. In the event of battery voltage loss, the CPC7594 enters the all-off state. 2.2 Under Voltage Switch Lock Out Circuitry 2.2.1 Introduction Smart logic in the CPC7594 now provides for switch state control during both power up and power loss transitions. An internal detector is used to evaluate the VDD supply to determine when to de-assert the under voltage switch lock out circuitry with a rising VDD and when to assert the under voltage switch lock out circuitry with a falling VDD. Any time unsatisfactory low VDD conditions exist the lock out circuit overrides user switch control by blocking the information at the external input pins and conditioning internal switch commands to the all off state. Upon restoration of VDD the switches will remain in the all-off state until the LATCH input is pulled low. The rising VDD lock out release threshold is internally set to ensure all internal logic is properly biased and functional before accepting external switch commands from the inputs to control the switch states. For a falling VDD event, the lock out threshold is set to assure proper logic and switch behavior up to the moment the switches are forced off and external inputs are suppressed.
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CPC7594
To facilitate hot plug insertion and power up control the LATCH pin has an integrated weak pull up resistor to the VDD power rail that will hold a non-driven LATCH pin at a logic high state. This enables board designers to use the CPC7594 with FPGAs and other devices that provide high impedance outputs during power up and configuration. The weak pull up allows a fan out of up to 32 when the system's LATCH control driver has a logic low minimum sink capability of 4mA. 2.2.2 Hot Plug and Power Up Circuit Design Considerations There are six possible start up scenarios that can occur during power up. They are: 1. 2. 3. 4. 5. 6. All inputs defined at power up & LATCH = 0 All inputs defined at power up & LATCH = 1 All inputs defined at power up & LATCH = Z All inputs not defined at power up & LATCH = 0 All inputs not defined at power up & LATCH = 1 All inputs not defined at power up & LATCH = Z 2.3 Switch Logic 2.3.1 Start-up The CPC7594 uses smart logic to monitor the VDD supply. Any time the VDD is below an internally set threshold, the smart logic places the control logic to the all-off state. An internal pullup at the LATCH pin locks the CPC7594 in the all-off state following start-up until the LATCH pin is pulled down to a logic low. Prior to the assertion of a logic low at the LATCH pin, the switch control inputs must be properly conditioned. 2.3.2 Switch Timing The CPC7594 provides, when switching from the ringing state to the talk state, the ability to control the release timing of the ringing switches SW3 and SW4 relative to the state of the switches SW1 and SW2 using simple TTL logic-level inputs. The two available techniques are referred to as make-before-break and break-before-make operation. When the break switch contacts of SW1 and SW2 are closed (made) before the ringing switch contacts of SW3 and SW4 are opened (broken), this is referred to as make-before-break operation. Break-before-make operation occurs when the ringing contacts of SW3 and SW4 are opened (broken) before the switch contacts of SW1 and SW2 are closed (made). With the CPC7594, make-before-break and break-before-make operations can easily be accomplished by applying the proper sequence of logic-level inputs to the device. The logic sequences for either mode of operation are provided in "Make-Before-Break Ringing to Talk Transition Logic Sequence" on page 14, "Break-Before-Make Ringing to Talk Transition Logic Sequence" on page 14, and "Alternate Break-Before-Make Ringing to Talk Transition Logic Sequence" on page 15. Logic states and input control settings are provided in "CPC7594xA and CPC7594xB Truth Table" on page 11 and "CPC7594xC Truth Table" on page 11. 2.3.3 Make-Before-Break Operation To use make-before-break operation, change the logic inputs from the ringing state directly to the talk state. Application of the talk state opens the ringing return switch, SW3, as the break switches SW1 and SW2 close. The ringing switch, SW4, remains closed until the next zero-crossing of the ringing current. While in the make-before-break state, ringing potentials in excess of the CPC7594 protection circuitry thresholds will be diverted away from the SLIC.
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Under all of the start up situations listed above the CPC7594 will hold all of it's switches in the all-off state during power up. When VDD requirements have been satisfied the LCAS will complete it's start up procedure in one of three conditions. For start up scenario 1 the CPC7594 will transition from the all off state to the state defined by the inputs when VDD is valid. For start up scenarios 2, 3, 5, and 6 the CPC7594 will power up in the all-off state and remain there until the LATCH pin is pulled low. This allows for an indefinite all off state for boards inserted into a powered system but are not configured for service or boards that need to wait for other devices to be configured first. Start up scenario 4 will start up with all switches in the all-off state but upon the acceptance of a valid VDD the LCAS will revert to one of the legitimate states listed in the truth tables and there after may randomly change states based on input pin leakage currents and loading. Because the LCAS state after power up can not be predicted with this start up condition it should never be utilized. On designs that do not wish to individually control the LATCH pins of multi-port cards it is possible to bus many (or all) of the LATCH pins together to create a single board level input enable control.
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CPC7594
Make-Before-Break Ringing to Talk Transition Logic Sequence
Break Switches Off Ringing Return Switch (SW3) On Ringing Switch (SW4) On Test Switches Off
State
INRINGING
INTEST
LATCH
TSD
Timing
Ringing Makebeforebreak Talk
1
0
SW4 waiting for next zero-current crossing to turn off. Maximum time is one-half of the ringing cycle. In this transition state current limited by the dc break switch current limit value will be sourced from the ring node of the SLIC. Zero-cross current has occurred
0
0
0
Z
On
Off
On
Off
0
0
On
Off
Off
Off
2.3.4 Break-Before-Make Operation Break-before-make operation of the CPC7594 can be achieved using two different techniques. The first method uses manipulation of the INRINGING and INTEST logic inputs as shown in "Break-Before-Make Ringing to Talk Transition Logic Sequence" on page 14. 1. At the end of the ringing state apply the all off state (1,1). This releases the ringing return switch (SW3) while the ringing switch (SW4) remains on, waiting for the next zero current event.
2. Hold the all off state for at least one-half of a ringing cycle to assure that a zero crossing event occurs and that SW4, the ringing switch, has opened. 3. Apply inputs for the next desired state. For the talk state, the inputs would be (0,0). Break-before-make operation occurs when the ringing switches open before the break switches SW1 and SW2 close.
Break-Before-Make Ringing to Talk Transition Logic Sequence
Break Switches Off Off Ringing Return Switch (SW3) On Off Ringing Switch (SW4) On On Test Switches Off Off
State
INRINGING
INTEST
LATCH
TSD
Timing
Ringing All-Off BreakBeforeMake Talk
1 1
0 1 0 Z
Hold this state for at least one-half of the ringing cycle. SW4 waiting for zero current to turn off. Zero current has occurred. SW4 has opened Break switches close.
1 0
1 0
Off On
Off Off
Off Off
Off Off
2.3.5 Alternate Break-Before-Make Operation The alternate break-before-make technique is available for all versions of the CPC7594. As shown in "CPC7594xA and CPC7594xB Truth Table" on page 11 and "CPC7594xC Truth Table" on page 11, the bi-directional TSD interface disables all of the switches when pulled to a logic low. Although logically disabled, an active ringing switch (SW4) will remain closed until the next zero crossing current event.
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As shown in the table "Alternate Break-Before-Make Ringing to Talk Transition Logic Sequence" on page 15, this operation is similar to the one shown in "Alternate Break-Before-Make Operation" on page 14, except in the method used to select the all off state, and in when the INRINGING and INTEST inputs are reconfigured for the talk state.
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CPC7594
1. Pull TSD to a logic low to end the ringing state. This opens the ringing return switch (SW3) and prevents any other switches from closing. 2. Keep TSD low for at least one-half the duration of the ringing cycle period to allow sufficient time for a zero crossing current event to occur and for the circuit to enter the break-before-make state. 3. During the TSD low period, set the INRINGING and INTEST inputs to the talk state (0, 0). 4. Release TSD, allowing the internal pull-up to activate the break switches. When using TSD as an input, the two recommended states are "0" which overrides the logic input pins and forces an all off state and "Z" which allows normal switch control via the logic input pins. This requires the use of an open-collector or open-drain type buffer. Forcing TSD to a logic high prevents the user from detecting a thermal shutdown condition and is therefore not recommended.
Alternate Break-Before-Make Ringing to Talk Transition Logic Sequence Ringing Ringing Return Break Test Switch Switches Switch Switches (SW4) (SW3) Off Off On Off On On Off Off
State
INRINGING 1 1
INTEST 0 0
LATCH
TSD Z
Timing
Ringing All-Off BreakBeforeMake Talk
0
Hold this state for at least one-half of the ringing cycle. SW4 waiting for zero current to turn off. SW4 has opened
X 0 0 0 0 0
0
Off On
Off Off
Off Off
Off Off
Z
Close Break Switches
2.4 Data Latch The CPC7594 has an integrated transparent data latch. The latch enable operation is controlled by TTL logic input levels at the LATCH pin. Data input to the latch is via the input pins INRINGING and INTEST while the output of the data latch are internal nodes used for state control. When the LATCH enable control pin is at a logic 0 the data latch is transparent and the input control signals flow directly through the data latch to the state control circuitry. A change in input will be reflected by a change in the switch state. Whenever the LATCH enable control pin is at logic 1, the data latch is active and data is locked. Subsequent changes to the input controls INRINGING and INTEST will not result in a change to the control logic or affect the existing switch state.
The switches will remain in the state they were in when the LATCH changes from logic 0 to logic 1 and will not respond to changes in input as long as the LATCH is at logic 1. However, neither the TSD input nor the TSD output control functions are affected by the latch function. Since internal thermal shutdown control and external "All-off" control is not affected by the state of the LATCH enable input, TSD will override state control. 2.5 TSD Pin Description The TSD pin is a bi-directional I/O structure with an internal pull-up current source having a nominal value of 16 A biased from VDD. As an output, this pin indicates the status of the thermal shutdown circuitry. Typically, during normal operation, this pin will be pulled up to VDD but under fault conditions that create excess thermal loading the CPC7594 will enter thermal shutdown and a logic low will be output.
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CPC7594
As an input, the TSD pin is utilized to place the CPC7594 into the "All-Off" state by simply pulling the input to a logic low. For applications using low-voltage logic devices (lower than VDD), Clare recommends the use of an open-collector or an open-drain type output to control TSD. This avoids sinking the TSD pull up bias current to ground during normal operation when the all-off state is not required. In general, Clare recommends all applications use an open-collector or open-drain type device to drive this pin. Unlike the CPC7584, driving TSD to a logic 1 or tying this pin to VCC will not prevent normal operation of the thermal shutdown circuitry inside the CPC7594. As a result the TSD pin may be held at a logic high. However, the CPC7594 TSD pin has only two recommended operating states when it is used as an input control. A logic 0, which forces the device to the all-off state and a high impedance (Z) state for normal operation. This requires the use of an open-collector or open-drain type buffer. 2.6 Ringing Switch Zero-Cross Current Turn Off After the application of a logic input to turn SW4 off, the ringing switch is designed to delay the change in state until the next zero-crossing. Once on, the switch requires a zero-current cross to turn off, and therefore should not be used to switch a pure DC signal. The switch will remain in the on state no matter the logic input until the next zero crossing. These switching characteristics will reduce and possibly eliminate overall system impulse noise normally associated with ringing switches. See Clare's application note AN-144, Impulse Noise Benefits of Line Card Access Switches for more information. The attributes of ringing switch SW4 may make it possible to eliminate the need for a zero-cross switching scheme. A minimum impedance of 300 in series with the ringing generator is recommended. 2.7 Power Supplies Both a +5 V supply and battery voltage are connected to the CPC7594. Switch state control is powered exclusively by the +5 V supply. As a result, the CPC7594 exhibits extremely low power consumption during active and idle states. Although battery power is not used for switch control, it is required to supply trigger current for the integrated internal protection circuitry SCR during fault conditions. This integrated SCR is designed to activate whenever the voltage at TBAT or RBAT drops 2 to 4 V below the applied voltage on the VBAT pin.
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Because the battery supply at this pin is required to source trigger current during negative overvoltage fault conditions at tip and ring, it is important that the net supplying this current be a low impedance path for high speed transients such as lightning. This will permit trigger currents to flow enabling the SCR to activate and thereby prevent a fault induced negative overvoltage event at the TBAT or RBAT nodes. 2.8 Battery Voltage Monitor The CPC7594 also uses the VBAT voltage to monitor battery voltage. If system battery voltage is lost, the CPC7594 immediately enters the all-off state. It remains in this state until the battery voltage is restored. The device also enters the all-off state if the battery voltage rises more positive than about -10 V with respect to ground and remains in the all-off state until the battery voltage drops below approximately -15 V with respect to ground. This battery monitor feature draws a small current from the battery (less than 1 A typical) and will add slightly to the device's overall power dissipation. This monitor function performs properly if the CPC7594 and SLIC share a common battery supply origin. Otherwise, if battery is lost to the CPC7594 but not to the SLIC, then the VBAT pin will be internally biased by the potential applied at the TBAT or RBAT pins via the internal protection circuitry SCR trigger current path. 2.9 Protection 2.9.1 Diode Bridge/SCR The CPC7594 uses a combination of current limited break switches, a diode bridge/SCR clamping circuit, and a thermal shutdown mechanism to protect the SLIC device or other associated circuitry from damage during line transient events such as lightning. During a positive transient condition, the fault current is conducted through the diode bridge to ground via FGND. Voltage is clamped to a diode drop above ground. During a negative transient of 2 to 4 V more negative than the voltage source at VBAT, the SCR conducts and faults are shunted to FGND via the SCR or the diode bridge.
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CPC7594
In order for the SCR to crowbar (or foldback), the SCR's on-voltage (see "Protection Circuitry Electrical Specifications" on page 10) must be less than the applied voltage at the VBAT pin. If the VBAT voltage is less negative than the SCR on-voltage or if the VBAT supply is unable to source the trigger current, the SCR will not crowbar. For power induction or power-cross fault conditions, the positive cycle of the transient is clamped to a diode drop above ground and the fault current directed to ground. The negative cycle of the transient will cause the SCR to conduct when the voltage exceeds the VBAT reference voltage by two to four volts, steering the fault current to ground. Note: The CPC7594xB does not contain the protection SCR but instead uses diodes to clamp both polarities of a transient fault. These diodes direct the negative potential's fault current to the VBAT pin. 2.9.2 Current Limiting function If a lightning strike transient occurs when the device is in the talk state, the current is passed along the line to the integrated protection circuitry and restricted by the dynamic current limit response of the active switches. During the talk state, when a 1000V 10x1000 s lightning pulse (GR-1089-CORE) is applied to the line though a properly clamped external protector, the current seen at TLINE and RLINE will be a pulse with a typical magnitude of 2.5 A and a duration less than 0.5 s. If a power-cross fault occurs with the device in the talk state, the current is passed though break switches SW1 and SW2 on to the integrated protection circuit but is limited by the dynamic DC current limit response of the two break switches. The DC current limit specified over temperature is between 80 mA and 425 mA and the circuitry has a negative temperature coefficient. As a result, if the device is subjected to extended heating due to a power cross fault condition, the measured current at TLINE and RLINE will decrease as the device temperature increases. If the device temperature rises sufficiently, the temperature shutdown mechanism will activate and the device will enter the all-off state. 2.10 Thermal Shutdown The thermal shutdown mechanism activates when the device die temperature reaches a minimum of 110 C, placing the device in the all-off state regardless of logic input. During thermal shutdown events the TSD pin will output a logic low with a nominal 0 V level. A logic high is output from the TSD pin during normal operation with a typical output level equal to VDD. If presented with a short duration transient such as a lightning event, the thermal shutdown feature will typically not activate. But in an extended power-cross event, the device temperature will rise and the thermal shutdown mechanism will activate forcing the switches to the all-off state. At this point the current measured into TLINE or RLINE will drop to zero. Once the device enters thermal shutdown it will remain in the all-off state until the temperature of the device drops below the de-activation level of the thermal shutdown circuit. This permits the device to autonomously return to normal operation. If the transient has not passed, current will again flow up to the value allowed by the dynamic DC current limiting of the switches and heating will resume, reactivating the thermal shutdown mechanism. This cycle of entering and exiting the thermal shutdown mode will continue as long as the fault condition persists. If the magnitude of the fault condition is great enough, the external secondary protector will activate shunting the fault current to ground. 2.11 External Protection Elements The CPC7594 requires only over voltage secondary protection on the loop side of the device. The integrated protection feature described above negates the need for additional external protection on the SLIC side. The secondary protector must limit voltage transients to levels that do not exceed the breakdown voltage or input-output isolation barrier of the CPC7594. A foldback or crowbar type protector is recommended to minimize stresses on the CPC7594. Consult Clare's application note, AN-100, "Designing Surge and Power Fault Protection Circuits for Solid State Subscriber Line Interfaces" for equations related to the specifications of external secondary protectors, fused resistors and PTCs.
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CPC7594
3. Manufacturing Information
3.1 Mechanical Dimensions 3.1.1 DFN
7.00 0.25 (0.276 0.01)
6.00 0.25 (0.236 0.01)
INDEX AREA 0.90 0.10 (0.035 0.004)
TOP VIEW
0.02, + 0.03, - 0.02 (0.0008, + 0.0012, - 0.0008) 1
SIDE VIEW 0.30 0.05 (0.012 0.002)
SEATING PLANE 0.20 (0.008)
EXPOSED METALLIC PAD
4.25 0.05 (0.167 0.002)
Terminal Tip 0.80 (0.032) 16 6.00 0.05 (0.236 0.002) BOTTOM VIEW Dimensions mm (inch) 0.55 0.10 (0.022 0.004)
3.1.2 SOIC
10.211 0.254 (0.402 0.010)
NOTES: 1. Coplanarity = 0.1016 (0.004) max. 2. Leadframe thickness does not include solder plating (1000 microinch maximum).
PIN 16 10.312 0.381 (0.406 0.015) 7.493 0.127 (0.295 0.005) DIMENSIONS mm (inches) 1.270 TYP (0.050 TYP) 0.406 0.076 (0.016 0.003) 0.254 MIN / 0.737 MAX X 45 (0.010 MIN / 0.029 MAX X 45)
PIN 1
2.337 0.051 (0.092 0.002)
2.540 0.152 (0.100 0.006)
0.649 0.102 (0.026 0.004)
0.203 0.102 (0.008 0.004)
0.889 0.178 (0.035 0.007)
0.2311 MIN / 0.3175 MAX (0.0091 MIN / 0.0125 MAX)
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CPC7594
3.2 Printed-Circuit Board Layout 3.2.1 DFN
0.35 (0.014)
3.2.2 SOIC
1.27 (0.050)
1.05 (0.041) 5.80 (0.228)
9.40 (0.370)
2.00 (0.079)
0.80 (0.031)
DIMENSIONS mm (inches)
NOTE: As the metallic pad on the bottom of the DFN package is connected to the substrate of the die, Clare recommends that no printed circuit board traces or vias be placed under this area to maintain minimum creepage and clearance values.
0.60 (0.024)
DIMENSIONS mm (inches)
3.3 Tape and Reel Packaging 3.3.1 DFN
330.2 Dia (13.00 Dia) Top Cover Tape Thickness 0.102 Max (0.004 Max) Pin 1 W=16.00 + 0.30 (0.630 + 0.012) B0=7.24 + 0.10 (0.285 + 0.004)
Embossed Carrier
K0=1.61 + 0.10 (0.063 + 0.004)
P=12.00 + 0.10 (0.472 + 0.004)
A0=6.24 + 0.10 (0.246 + 0.004)
User Direction of Feed
Embossment
Dimensions mm (inches)
NOTE: Tape dimensions not shown comply with JEDEC Standard EIA-481-2
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CPC7594
3.3.2 SOIC
330.2 Dia (13.00 Dia) Top Cover Tape Thickness 0.102 Max (0.004 Max) Top Cover Tape P=12.00 (0.47) A0=10.90 + 0.15 (0.429 + 0.010) Dimensions mm (inches) Pin 1 B0=10.70 + 0.15 (0.421 + 0.01)
W=16.00 + 0.30 (0.630 + 0.010)
K0=3.20 + 0.15 (0.193 + 0.01) K1=2.70 + 0.15 (0.106 + 0.01)
Embossed Carrier
User Direction of Feed
Embossment
NOTE: Tape dimensions not shown comply with JEDEC Standard EIA-481-2
3.4 Soldering 3.4.1 Moisture Reflow Sensitivity Clare has characterized the moisture reflow sensitivity for this product using IPC/JEDEC standard J-STD-020. Moisture uptake from atmospheric humidity occurs by diffusion. During the solder reflow process, in which the component is attached to the PCB, the whole body of the component is exposed to high process temperatures. The combination of moisture uptake and high reflow soldering temperatures may lead to moisture induced delamination and cracking of the component. To prevent this, this component must be handled in accordance with IPC/JEDEC standard J-STD-033 per the labeled moisture sensitivity level (MSL), level 1 for the SOIC package, and level 3 for the DFN package.
3.4.2 Reflow Profile For proper assembly, this component must be processed in accordance with the current revision of IPC/JEDEC standard J-STD-020. Failure to follow the recommended guidelines may cause permanent damage to the device resulting in impaired performance and/or a reduced lifetime expectancy.
3.5 Washing Clare does not recommend ultrasonic cleaning of this part.
Pb
RoHS
2002/95/EC
e3
For additional information please visit www.clare.com
Clare, Inc. makes no representations or warranties with respect to the accuracy or completeness of the contents of this publication and reserves the right to make changes to specifications and product descriptions at any time without notice. Neither circuit patent licenses or indemnity are expressed or implied. Except as set forth in Clare's Standard Terms and Conditions of Sale, Clare, Inc. assumes no liability whatsoever, and disclaims any express or implied warranty relating to its products, including, but not limited to, the implied warranty of merchantability, fitness for a particular purpose, or infringement of any intellectual property right. The products described in this document are not designed, intended, authorized, or warranted for use as components in systems intended for surgical implant into the body, or in other applications intended to support or sustain life, or where malfunction of Clare's product may result in direct physical harm, injury, or death to a person or severe property or environmental damage. Clare, Inc. reserves the right to discontinue or make changes to its products at any time without notice. Specifications: DS-CPC7594 - R03 (c) Copyright 2009, Clare, Inc. All rights reserved. Printed in USA. 10/14/09
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